Tech-Method Course:

Advanced Microscopy: Optical and Correlative Techniques

Date

June 2026

Organizer

Simona Rodighiero (IEO) Dario Parazzoli (IFOM)

Location

IEO Campus, Via Adamello 16 - Milan

About the Course

The advanced course presents key high-end imaging modalities, including TIRF, two-photon/SHG, light-sheet and super-resolution microscopy. It also addresses quantitative F-techniques such as FRAP, FRET and FLIM, together with the principles of correlative light and electron microscopy (CLEM). The program provides a structured overview of advanced methodologies for comprehensive biological imaging.

Schedule to be communicated