Tech-Method Course:
Advanced Microscopy: Optical and Correlative Techniques
Date
30 June & 1, 2 July 2026
Organizer
Simona Rodighiero (IEO) Dario Parazzoli (IFOM)
Location
IEO Campus, Via Adamello 16 - Milan
About the Course
The advanced course presents key high-end imaging modalities, including TIRF, two-photon/SHG, light-sheet and super-resolution microscopy. It also addresses quantitative F-techniques such as FRAP, FRET and FLIM, together with the principles of correlative light and electron microscopy (CLEM). The program provides a structured overview of advanced methodologies for comprehensive biological imaging.
Total number of credits: 4
Lessons location: Silver Room
9:00-12:00
– F-techniques (FRAP, FRET, FLIM, FRET-FLIM)
Sara Barozzi, Dario Parazzoli
– Two-Photon (2P), Second Harmonic Generation (SHG) and Label-Free microscopy
Zeno Lavagnino
12:00-13:00
Lunch Break
13:00-16:00
– TIRF and HILO microscopy
Dario Parazzoli
– Big sample preparation
Fabrizio Orsenigo
– Light Sheet Fluorescence Microscopy
Zeno Lavagnino
Lessons location: Meeting Room 1-2
9:00-12:00
– Introduction to Super Resolution
Dario Parazzoli
– STimulated Emission Depletion (STED) microscopy
Dario Parazzoli
– Structured Illumination Microscopy (SIM)
Simona Rodighiero
12:00-13:00
Lunch Break
13:00-16:00
– Single Molecule Localization Microscopy (SMLM)
Mario Faretta
– MINimal photon FLUXes (MINFLUX)
Zeno Lavagnino
– Expansion Microscopy (ExM)
Simona Rodighiero
Lessons location: Coral Room
9:00-13:00
– Nils Gauthier seminar
– EM introduction
Simona Rodighiero
– Correlative microscopy
Galina Beznusenko