Tech-Method Course:
Advanced Microscopy: Optical and Correlative Techniques
Date
30 June & 1, 2 July 2026
Organizer
Simona Rodighiero (IEO) Dario Parazzoli (IFOM)
Location
IEO Campus, Via Adamello 16 - Milan
About the Course
The advanced course presents key high-end imaging modalities, including TIRF, two-photon/SHG, light-sheet and super-resolution microscopy. It also addresses quantitative F-techniques such as FRAP, FRET and FLIM, together with the principles of correlative light and electron microscopy (CLEM). The program provides a structured overview of advanced methodologies for comprehensive biological imaging.
Lessons location: Silver Room
9:00-12:00
– F-techniques (FRAP, FRET, FLIM, FRET-FLIM)
– Two-Photon (2P), Second Harmonic Generation (SHG) and Label-Free microscopy
12:00-13:00
Lunch Break
13:00-16:00
– TIRF and HILO microscopy
– Big sample preparation
– Light Sheet Fluorescence Microscopy
Lessons location: Meeting Room 1-2
9:00-12:00
– Introduction to Super Resolution
– STimulated Emission Depletion (STED) microscopy
– Structured Illumination Microscopy (SIM)
12:00-13:00
Lunch Break
13:00-16:00
– Single Molecule Localization Microscopy (SMLM)
– MINimal photon FLUXes (MINFLUX)
– Expansion Microscopy (ExM)
Lessons location: Coral Room
9:00-13:00
– EM introduction
– Correlative microscopy
– Nils Gauthier seminar